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Integrated Device Technology collaborates on development of testing equipment for advanced memory buffer devices

 
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Integrated Device Technology (IDT) announced it has collaborated with test and measurement companies Wavecrest and SyntheSys Research to optimize high-speed test equipment for the industry’s advanced memory buffer (AMB) offerings.

AMB devices are an essential building block for fully buffered dual-inline memory modules (FB-DIMM) targeting applications in server, workstation and communications equipment that require increased performance and large memory capacities. “IDT is committed to addressing the needs of high-end computing applications by building out the AMB ecosystem,” said Tom Kao, director of marketing for the IDT DIMM support products group.  “We are pleased that Wavecrest and SyntheSys Research have chosen our AMB part as the benchmark for developing their equipment.  This serves as a testament to our leadership and innovation in this area, as well as our ability to meet market demand with timely solutions.”  According to Charlie Schaffer, vice president of marketing at SyntheSys Research, “When looking for an AMB supplier to develop application-specific features for our BERTScope, IDT was the only commercial vendor able to provide samples.  In addition, the company is widely recognized as being on the leading edge of DIMM support-product technology, and has a strong history of establishing strategic partnerships with leading providers of semiconductors for computing applications.”

Our combined expertise has resulted in a test and measurement solution that is certain to accelerate market acceptance of FB-DIMM technologies,” said Dennis Leisz, president and CEO of Wavecrest.  “Using our test and measurement equipment, designers for high-bandwidth server applications can be assured they are receiving solutions that meet today’s stringent signal integrity demands.”

The BERTScopeTM from SyntheSys Research is the industry’s first multi-Gb/s testing instrument that combines the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with Bit Error Rate (BER) pattern generation and analysis.  The Wavecrest SIA 3600D Signal Integrity Analysis Solution is a performance-enhancing test and measurement system specifically optimized for clock and datacom applications where signal integrity becomes the most critical test for determining overall performance and interoperability.

For more information on the full range of Integrated Device Technology products available from Anglia please call +44 (0)1945 474747 or email info@anglia.com

 

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This news article was originally published in January 2006.

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4/4/06